IDRC,Electromigration Testing

Wafer Reliability Equipment (停產)

特殊產品 >> Constant Current Model Electromigration Testing

●	30 Independent programmable current sources per board。	Discontinued products
●	Total 1200 DUT tested once time。
●	All 1200 channel independent operation。
●	Each measurement unit Build-in Microprocessor。
●	測試電流 : DC 0.001mA – 199.9mA。
●	測試電壓 : DC 0.01V –12.0V。
●	測試電阻: 0.01 Ω – 20.00 KΩ。
●	Measures Extrusion Current ( 1 microAmp resolution )。
●	Ultra-stable Current Sources(0.1%, 1000 HRs)。
●	掃瞄記錄時間: 1200 CH / 60 SEC。
●	ABS : RS-485 Antilock Bus System。
●	提供 R/I 校驗點功能.可供外部定期校驗用。
●	Automatic Calibration。
●	Easy to Calibrate : Resistance and Voltage Calibration Board。