IDRC,Electromigration Testing

Wafer Reliability Equipment (停产)

特殊产品 >> Constant Current Model Electromigration Testing

●	30 Independent programmable current sources per board。	Discontinued products
●	Total 1200 DUT tested once time。
●	All 1200 channel independent operation。
●	Each measurement unit Build-in Microprocessor。
●	测试电流 : DC 0.001mA – 199.9mA。
●	测试电压 : DC 0.01V –12.0V。
●	测试电阻: 0.01 Ω – 20.00 KΩ。
●	Measures Extrusion Current ( 1 microAmp resolution )。
●	Ultra-stable Current Sources(0.1%, 1000 HRs)。
●	扫瞄记录时间: 1200 CH / 60 SEC。
●	ABS : RS-485 Antilock Bus System。
●	提供 R/I 校验点功能.可供外部定期校验用。
●	Automatic Calibration。
●	Easy to Calibrate : Resistance and Voltage Calibration Board。